Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)


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A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl, H) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.

作者简介

A. Chichinin

Voevodsky Institute of Chemical Kinetics and Combustion; Novosibirsk State University

编辑信件的主要联系方式.
Email: Chichinin@kinetics.nsc.ru
俄罗斯联邦, Novosibirsk, 630090; Novosibirsk, 630090

M. Poretskiy

Institut für Physikalische und Theoretische Chemie

Email: Chichinin@kinetics.nsc.ru
德国, Braunschweig, 38106

C. Maul

Institut für Physikalische und Theoretische Chemie

Email: Chichinin@kinetics.nsc.ru
德国, Braunschweig, 38106

K.-H. Gericke

Institut für Physikalische und Theoretische Chemie

Email: Chichinin@kinetics.nsc.ru
德国, Braunschweig, 38106

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