Мақаланы E-mail арқылы жіберу Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector
- Авторлар: Huang J.1, Huang Z.1, Andreev Y.M.2,3, Kokh K.A.4,5, Lanskii G.V.2,3, Potekaev A.I.3,6, Svetlichnyi V.A.3,5
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Мекемелер:
- Shanghai Institute of Technical Physics of the Chinese Academy of Sciences
- Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences
- National Research Tomsk State University
- V. S. Sobolev Institute of Geology and Mineralogy of the Siberian Branch of the Russian Academy of Sciences
- Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
- Шығарылым: Том 60, № 9 (2018)
- Беттер: 1638-1643
- Бөлім: Article
- URL: https://journals.rcsi.science/1064-8887/article/view/239422
- DOI: https://doi.org/10.1007/s11182-018-1262-4
- ID: 239422
Дәйексөз келтіру
Ашық рұқсат
Рұқсат берілді
Тек жазылушылар үшін
Аннотация
Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon wafers are recorded with simultaneous determination of the wafer parameters (thickness/material).
Авторлар туралы
J.-G. Huang
Shanghai Institute of Technical Physics of the Chinese Academy of Sciences
Хат алмасуға жауапты Автор.
Email: jghuang@mail.sitp.ac.cn
ҚХР, Shanghai
Z.-M. Huang
Shanghai Institute of Technical Physics of the Chinese Academy of Sciences
Email: jghuang@mail.sitp.ac.cn
ҚХР, Shanghai
Yu. Andreev
Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: jghuang@mail.sitp.ac.cn
Ресей, Tomsk; Tomsk
K. Kokh
V. S. Sobolev Institute of Geology and Mineralogy of the Siberian Branch of the Russian Academy of Sciences; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: jghuang@mail.sitp.ac.cn
Ресей, Novosibirsk; Tomsk
G. Lanskii
Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: jghuang@mail.sitp.ac.cn
Ресей, Tomsk; Tomsk
A. Potekaev
National Research Tomsk State University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
Email: jghuang@mail.sitp.ac.cn
Ресей, Tomsk; Tomsk
V. Svetlichnyi
National Research Tomsk State University; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: jghuang@mail.sitp.ac.cn
Ресей, Tomsk; Tomsk
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