Email this article Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector
- Authors: Huang J.1, Huang Z.1, Andreev Y.M.2,3, Kokh K.A.4,5, Lanskii G.V.2,3, Potekaev A.I.3,6, Svetlichnyi V.A.3,5
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Affiliations:
- Shanghai Institute of Technical Physics of the Chinese Academy of Sciences
- Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences
- National Research Tomsk State University
- V. S. Sobolev Institute of Geology and Mineralogy of the Siberian Branch of the Russian Academy of Sciences
- Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
- Issue: Vol 60, No 9 (2018)
- Pages: 1638-1643
- Section: Article
- URL: https://journals.rcsi.science/1064-8887/article/view/239422
- DOI: https://doi.org/10.1007/s11182-018-1262-4
- ID: 239422
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Abstract
Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon wafers are recorded with simultaneous determination of the wafer parameters (thickness/material).
About the authors
J.-G. Huang
Shanghai Institute of Technical Physics of the Chinese Academy of Sciences
Author for correspondence.
Email: jghuang@mail.sitp.ac.cn
China, Shanghai
Z.-M. Huang
Shanghai Institute of Technical Physics of the Chinese Academy of Sciences
Email: jghuang@mail.sitp.ac.cn
China, Shanghai
Yu. M. Andreev
Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: jghuang@mail.sitp.ac.cn
Russian Federation, Tomsk; Tomsk
K. A. Kokh
V. S. Sobolev Institute of Geology and Mineralogy of the Siberian Branch of the Russian Academy of Sciences; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: jghuang@mail.sitp.ac.cn
Russian Federation, Novosibirsk; Tomsk
G. V. Lanskii
Institute of Monitoring of Climatic and Ecological Systems of the Siberian Branch of the Russian Academy of Sciences; National Research Tomsk State University
Email: jghuang@mail.sitp.ac.cn
Russian Federation, Tomsk; Tomsk
A. I. Potekaev
National Research Tomsk State University; V. D. Kuznetsov Siberian Physical-Technical Institute at Tomsk State University
Email: jghuang@mail.sitp.ac.cn
Russian Federation, Tomsk; Tomsk
V. A. Svetlichnyi
National Research Tomsk State University; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
Email: jghuang@mail.sitp.ac.cn
Russian Federation, Tomsk; Tomsk
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