Estimation of the effect of technological irregularities of the slow-wave structure on parameters of microwave devices

Abstract

Variations in some parameters of microwave electronic devices under the action of technological irregularities are approximately estimated. The original electromagnetic problem with random boundary conditions is reduced to calculation of interaction between the electron flow and the electromagnetic field of the slow-wave structure with parameters gradually varying along the flow (for this purpose, an irregularity displacement theorem is proved). The use of the Cauchy distribution, which is similar to the normal distribution of irregularities over the cells reduces calculation to simple estimation formulas. The calculation procedure is illustrated by the example of estimations for a travelling-wave tube and a backward-wave tube with a flat comb-type slow-wave structure.