A holographic method of the quantitative measurement of photolithographic replicas of thick raised surface defects
- Авторлар: Budnikov N.1, Dudenkova V.1, Kotomina V.1, Morozov O.1, Semenov V.2
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Мекемелер:
- Lobachevsky State University of Nizhny Novgorod
- Razuvaev Institute of Organometallic Chemistry
- Шығарылым: Том 43, № 6 (2017)
- Беттер: 539-541
- Бөлім: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/204916
- DOI: https://doi.org/10.1134/S1063785017060050
- ID: 204916
Дәйексөз келтіру
Аннотация
To solve the problem of the evaluation of the characteristic sizes and patterns of surface microdefects of complex-shaped samples, a holographic method for the measurement of transparent replicas representing an inverse impression of the investigated surface is proposed. This measurement method is based on the digital registration of the interferograms of a polymeric replica in the modified off-axis Leith–Upatnieks holographic scheme and on the calculation of the phase-incursion difference from a series of reconstructed digital holograms.
Авторлар туралы
N. Budnikov
Lobachevsky State University of Nizhny Novgorod
Email: orannge@mail.ru
Ресей, Nizhny Novgorod, 603022
V. Dudenkova
Lobachevsky State University of Nizhny Novgorod
Хат алмасуға жауапты Автор.
Email: orannge@mail.ru
Ресей, Nizhny Novgorod, 603022
V. Kotomina
Lobachevsky State University of Nizhny Novgorod
Email: orannge@mail.ru
Ресей, Nizhny Novgorod, 603022
O. Morozov
Lobachevsky State University of Nizhny Novgorod
Email: orannge@mail.ru
Ресей, Nizhny Novgorod, 603022
V. Semenov
Razuvaev Institute of Organometallic Chemistry
Email: orannge@mail.ru
Ресей, Nizhny Novgorod, 603950