Technical Physics Letters
ISSN 1063-7850 (Print)
ISSN 1090-6533 (Online)
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Keywords
Fullerene
Mach Number
Martensite
Shock Wave
Technical Physic Letter
dark current.
epitaxy
heterostructure
high-electron-mobility transistor
magnetic field
mass spectrum
molecular beam epitaxy
multijunction solar cell
photoluminescence
plasma
quantum dots
semiconductor laser
silicon
tokamak
wide-bandgap semiconductors
zinc oxide
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Keywords
Fullerene
Mach Number
Martensite
Shock Wave
Technical Physic Letter
dark current.
epitaxy
heterostructure
high-electron-mobility transistor
magnetic field
mass spectrum
molecular beam epitaxy
multijunction solar cell
photoluminescence
plasma
quantum dots
semiconductor laser
silicon
tokamak
wide-bandgap semiconductors
zinc oxide
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For Authors
For Librarians
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Author Details
Author Details
Drozdov, Yu.
Issue
Section
Title
File
Vol 42, No 3 (2016)
Article
Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters
Vol 42, No 8 (2016)
Article
Extremely deep profiling analysis of the atomic composition of thick (>100 μm) GaAs layers within power PIN diodes by secondary ion mass spectrometry
Vol 43, No 5 (2017)
Article
Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry
Vol 44, No 4 (2018)
Article
New Cluster Secondary Ions for Quantitative Analysis of the Concentration of Boron Atoms in Diamond by Time-of-Flight Secondary-Ion Mass Spectrometry
Vol 44, No 4 (2018)
Article
A New Limitation of the Depth Resolution in TOF-SIMS Elemental Profiling: the Influence of a Probing Ion Beam
Vol 45, No 1 (2019)
Article
A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials
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