An Antireflection Coating of a Germanium Subcell in GaInP/GaAs/Ge Solar Cells


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Abstract

Spectral characteristics of the Ge subcell of triple-junction GaInP/GaAs/Ge solar cells have been simulated. It was shown that using a GaInP nucleation layer that creates a shallow diffusion pn junction in Ge can raise the photogeneration current of the Ge subcell by ~4.5 mA/cm2 as compared with the value in the case of a GaAs nucleation layer. The optimal thickness of the GaInP layer (170–180 nm) makes it possible to additionally raise the photocurrent by ~1.5 mA/cm2. It was experimentally demonstrated that the photogenerated current of the Ge subcell of GaInP/GaAs/Ge solar cells increases by 3.9 mA/cm2 on replacing the GaAs nucleation layer with GaInP and there is an additional gain by 0.9 mA/cm2 on using the optimal thickness of the GaInP nucleation layer.

About the authors

S. A. Mintairov

Ioffe Physical Technical Institute

Author for correspondence.
Email: mintairov@scell.ioffe.ru
Russian Federation, St. Petersburg

V. M. Emel’yanov

Ioffe Physical Technical Institute

Email: mintairov@scell.ioffe.ru
Russian Federation, St. Petersburg

N. A. Kalyuzhnyi

Ioffe Physical Technical Institute

Email: mintairov@scell.ioffe.ru
Russian Federation, St. Petersburg

V. M. Andreev

Ioffe Physical Technical Institute

Email: mintairov@scell.ioffe.ru
Russian Federation, St. Petersburg


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