Email this article Intracavity Waveguide Spectroscopy of Thin Films
- Authors: Shulga A.V.1, Khomchenko A.V.1, Shilova I.V.1
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Affiliations:
- Belarusian–Russian University
- Issue: Vol 44, No 11 (2018)
- Pages: 953-955
- Section: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/208009
- DOI: https://doi.org/10.1134/S1063785018110159
- ID: 208009
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Abstract
The method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.
About the authors
A. V. Shulga
Belarusian–Russian University
Email: avkh@mogilev.by
Belarus, Mogilev, 212000
A. V. Khomchenko
Belarusian–Russian University
Author for correspondence.
Email: avkh@mogilev.by
Belarus, Mogilev, 212000
I. V. Shilova
Belarusian–Russian University
Email: avkh@mogilev.by
Belarus, Mogilev, 212000
