Intracavity Waveguide Spectroscopy of Thin Films
- Авторы: Shulga A.1, Khomchenko A.1, Shilova I.1
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Учреждения:
- Belarusian–Russian University
- Выпуск: Том 44, № 11 (2018)
- Страницы: 953-955
- Раздел: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/208009
- DOI: https://doi.org/10.1134/S1063785018110159
- ID: 208009
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Аннотация
The method of intracavity waveguide spectroscopy for measuring low optical losses in thin films is proposed. The method also allows one to distinguish transverse and longitudinal modes in low-gain lasers without introducing considerable losses into the cavity.
Об авторах
A. Shulga
Belarusian–Russian University
Email: avkh@mogilev.by
Белоруссия, Mogilev, 212000
A. Khomchenko
Belarusian–Russian University
Автор, ответственный за переписку.
Email: avkh@mogilev.by
Белоруссия, Mogilev, 212000
I. Shilova
Belarusian–Russian University
Email: avkh@mogilev.by
Белоруссия, Mogilev, 212000