An electron-impact ionization study of molecular selenium beams
- Authors: Zavilopulo A.N.1, Shpenik O.B.1, Mykyta M.I.1, Mylymko A.M.1
-
Affiliations:
- Institute of Electron Physics
- Issue: Vol 42, No 4 (2016)
- Pages: 427-430
- Section: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/198816
- DOI: https://doi.org/10.1134/S1063785016040301
- ID: 198816
Cite item
Abstract
We describe the method and presents results of a mass-spectrometric investigation of the yield of positive ions formed as a result of the dissociative ionization of a molecular selenium beam by electron impact. Appearance energies of fragment ions have been determined from the ionization efficiency curves. The dynamics of formation of the molecular ions of selenium in a temperature interval of 420–495 K has been studied. The energy dependences of the efficiency of formation of singly charged Sen+ (n = 1–3) and doubly charged Se++ ions are analyzed.
About the authors
A. N. Zavilopulo
Institute of Electron Physics
Author for correspondence.
Email: gzavil@gmail.com
Ukraine, Uzhgorod, 88017
O. B. Shpenik
Institute of Electron Physics
Email: gzavil@gmail.com
Ukraine, Uzhgorod, 88017
M. I. Mykyta
Institute of Electron Physics
Email: gzavil@gmail.com
Ukraine, Uzhgorod, 88017
A. M. Mylymko
Institute of Electron Physics
Email: gzavil@gmail.com
Ukraine, Uzhgorod, 88017