Investigation of the Hydrogen Etching Effect of the SiC Surface on the Formation of Graphene Films
- Авторы: Lebedev S.P.1, Barash I.S.1, Eliseyev I.A.1, Dementev P.A.1, Lebedev A.A.1,2, Bulat P.V.3
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Учреждения:
- Ioffe Institute
- St. Petersburg State Electrotechnical University LETI
- ITMO University
- Выпуск: Том 64, № 12 (2019)
- Страницы: 1843-1849
- Раздел: Physics of Low-Dimensional Structures
- URL: https://journals.rcsi.science/1063-7842/article/view/204943
- DOI: https://doi.org/10.1134/S1063784219120144
- ID: 204943
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Аннотация
We have studied the effect of temperature and etching duration of the 4H-SiC (0001) surface in hydrogen on the structural perfection of graphene films grown by thermal destruction. Several technological modes have been identified that enable etching of the substrate without changing the stoichiometric composition of the surface. It has been demonstrated that pregrowth etching in hydrogen at T = 1600°C with a duration of 1 min makes it possible to obtain a more uniform and structurally perfect graphene than etching at T = 1300°C with a 30 min duration.
Об авторах
S. Lebedev
Ioffe Institute
Автор, ответственный за переписку.
Email: lebedev.sergey@mail.ioffe.ru
Россия, St. Petersburg, 194021
I. Barash
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Россия, St. Petersburg, 194021
I. Eliseyev
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Россия, St. Petersburg, 194021
P. Dementev
Ioffe Institute
Email: lebedev.sergey@mail.ioffe.ru
Россия, St. Petersburg, 194021
A. Lebedev
Ioffe Institute; St. Petersburg State Electrotechnical University LETI
Email: lebedev.sergey@mail.ioffe.ru
Россия, St. Petersburg, 194021; St. Petersburg, 197376
P. Bulat
ITMO University
Email: lebedev.sergey@mail.ioffe.ru
Россия, St. Petersburg, 197101
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