Investigation of the Hydrogen Etching Effect of the SiC Surface on the Formation of Graphene Films


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We have studied the effect of temperature and etching duration of the 4H-SiC (0001) surface in hydrogen on the structural perfection of graphene films grown by thermal destruction. Several technological modes have been identified that enable etching of the substrate without changing the stoichiometric composition of the surface. It has been demonstrated that pregrowth etching in hydrogen at T = 1600°C with a duration of 1 min makes it possible to obtain a more uniform and structurally perfect graphene than etching at T = 1300°C with a 30 min duration.

作者简介

S. Lebedev

Ioffe Institute

编辑信件的主要联系方式.
Email: lebedev.sergey@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

I. Barash

Ioffe Institute

Email: lebedev.sergey@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

I. Eliseyev

Ioffe Institute

Email: lebedev.sergey@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

P. Dementev

Ioffe Institute

Email: lebedev.sergey@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021

A. Lebedev

Ioffe Institute; St. Petersburg State Electrotechnical University LETI

Email: lebedev.sergey@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 194021; St. Petersburg, 197376

P. Bulat

ITMO University

Email: lebedev.sergey@mail.ioffe.ru
俄罗斯联邦, St. Petersburg, 197101

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