Ion-Optical System of an Ion Source with Energy Focusing in the Formed Beam
- 作者: Samsonova N.S.1, Gall’ N.R.1, Gall’ L.N.2, Averin I.A.2, Berdnikov A.S.2, Masyukevich S.V.2
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隶属关系:
- Ioffe Institute
- Institute of Analytical Instrumentation, Russian Academy of Sciences
- 期: 卷 64, 编号 4 (2019)
- 页面: 564-568
- 栏目: Electrophysics, Electron and Ion Beams, Physics of Accelerators
- URL: https://journals.rcsi.science/1063-7842/article/view/203321
- DOI: https://doi.org/10.1134/S1063784219040042
- ID: 203321
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详细
Ways to reduce ion beam intensity losses in a mass spectrometric ion source, which are caused by chromatic aberration of its immersion ion-optical system, are considered. These losses are rather significant in forming a beam from ions with a large energy spread. The reduction of aberration losses is especially important when ion sources are used jointly with mass analyzers with energy focusing. It is shown that these losses can be reduced significantly by using a new type of ion-optical system of the ion source, which includes achromatic elements. A special method for calculating such elements is given. Computer simulations have shown high efficiency of such elements in the ion-optical path of ion sources of mass spectrometers.
作者简介
N. Samsonova
Ioffe Institute
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 194021
N. Gall’
Ioffe Institute
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 194021
L. Gall’
Institute of Analytical Instrumentation, Russian Academy of Sciences
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103
I. Averin
Institute of Analytical Instrumentation, Russian Academy of Sciences
编辑信件的主要联系方式.
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103
A. Berdnikov
Institute of Analytical Instrumentation, Russian Academy of Sciences
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103
S. Masyukevich
Institute of Analytical Instrumentation, Russian Academy of Sciences
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103
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