Ion-Optical System of an Ion Source with Energy Focusing in the Formed Beam


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详细

Ways to reduce ion beam intensity losses in a mass spectrometric ion source, which are caused by chromatic aberration of its immersion ion-optical system, are considered. These losses are rather significant in forming a beam from ions with a large energy spread. The reduction of aberration losses is especially important when ion sources are used jointly with mass analyzers with energy focusing. It is shown that these losses can be reduced significantly by using a new type of ion-optical system of the ion source, which includes achromatic elements. A special method for calculating such elements is given. Computer simulations have shown high efficiency of such elements in the ion-optical path of ion sources of mass spectrometers.

作者简介

N. Samsonova

Ioffe Institute

Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 194021

N. Gall’

Ioffe Institute

Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 194021

L. Gall’

Institute of Analytical Instrumentation, Russian Academy of Sciences

Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103

I. Averin

Institute of Analytical Instrumentation, Russian Academy of Sciences

编辑信件的主要联系方式.
Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103

A. Berdnikov

Institute of Analytical Instrumentation, Russian Academy of Sciences

Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103

S. Masyukevich

Institute of Analytical Instrumentation, Russian Academy of Sciences

Email: agreer@bk.ru
俄罗斯联邦, St. Petersburg, 190103

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