Selection and design of the secondary electron channel of the time-of-flight mass spectrometer
- Authors: Fishkova T.Y.1, Basalaev A.A.1, Kuz’michev V.V.1,2
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Affiliations:
- Ioffe Physical Technical Institute
- Peter the Great St. Petersburg Polytechnic University
- Issue: Vol 61, No 3 (2016)
- Pages: 470-472
- Section: Short Communications
- URL: https://journals.rcsi.science/1063-7842/article/view/197005
- DOI: https://doi.org/10.1134/S1063784216030075
- ID: 197005
Cite item
Abstract
Computer simulation is carried out for selecting a compact electron-optical system of the channel for detecting secondary electrons formed during the interaction of xenon atoms or ions with energy of 1-30 keV with Xe atoms. The solid angle of passage of secondary electron beams in a wide range of their initial energies is calculated. The energy spectrum of secondary electrons with various energies is determined by constructing their deceleration curve.
About the authors
T. Ya. Fishkova
Ioffe Physical Technical Institute
Author for correspondence.
Email: fishkova@mail.ru
Russian Federation, Politekhnicheskaya ul. 26, St. Petersburg, 194021
A. A. Basalaev
Ioffe Physical Technical Institute
Email: fishkova@mail.ru
Russian Federation, Politekhnicheskaya ul. 26, St. Petersburg, 194021
V. V. Kuz’michev
Ioffe Physical Technical Institute; Peter the Great St. Petersburg Polytechnic University
Email: fishkova@mail.ru
Russian Federation, Politekhnicheskaya ul. 26, St. Petersburg, 194021; Politekhnicheskaya ul. 29, St. Petersburg, 194064