Email this article Electroelastic field of a sphere located in the vicinity of a plane piezoelectric surface
- Authors: Starkov A.S.1, Pakhomov O.V.1, Starkov I.A.2
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Affiliations:
- University of Information Technologies, Mechanics, and Optics
- SIX Research Centre, Department of Radio Electronics
- Issue: Vol 61, No 1 (2016)
- Pages: 23-27
- Section: Theoretical and Mathematical Physics
- URL: https://journals.rcsi.science/1063-7842/article/view/196704
- DOI: https://doi.org/10.1134/S1063784216010217
- ID: 196704
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Abstract
The electric field generated by a scanning probe microscope is determined. Analytical expressions for the electroelastic field in a piezoelectric sample and the external electric field are derived for a spherical probe. It is demonstrated that the coupling of elastic and electrostatic fields in the piezoelectric material leads to energy redistribution between such fields. This circumstance causes variations in the normal component of the electric field strength at the interface and the capacitance of a probe.
About the authors
A. S. Starkov
University of Information Technologies, Mechanics, and Optics
Author for correspondence.
Email: oleg.cryogenics@gmail.com
Russian Federation, Kronverkskii pr. 49, St. Petersburg, 197101
O. V. Pakhomov
University of Information Technologies, Mechanics, and Optics
Email: oleg.cryogenics@gmail.com
Russian Federation, Kronverkskii pr. 49, St. Petersburg, 197101
I. A. Starkov
SIX Research Centre, Department of Radio Electronics
Email: oleg.cryogenics@gmail.com
Czech Republic, Technicka 12, Brno, 61600
