Electroelastic field of a sphere located in the vicinity of a plane piezoelectric surface
- 作者: Starkov A.1, Pakhomov O.1, Starkov I.2
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隶属关系:
- University of Information Technologies, Mechanics, and Optics
- SIX Research Centre, Department of Radio Electronics
- 期: 卷 61, 编号 1 (2016)
- 页面: 23-27
- 栏目: Theoretical and Mathematical Physics
- URL: https://journals.rcsi.science/1063-7842/article/view/196704
- DOI: https://doi.org/10.1134/S1063784216010217
- ID: 196704
如何引用文章
详细
The electric field generated by a scanning probe microscope is determined. Analytical expressions for the electroelastic field in a piezoelectric sample and the external electric field are derived for a spherical probe. It is demonstrated that the coupling of elastic and electrostatic fields in the piezoelectric material leads to energy redistribution between such fields. This circumstance causes variations in the normal component of the electric field strength at the interface and the capacitance of a probe.
作者简介
A. Starkov
University of Information Technologies, Mechanics, and Optics
编辑信件的主要联系方式.
Email: oleg.cryogenics@gmail.com
俄罗斯联邦, Kronverkskii pr. 49, St. Petersburg, 197101
O. Pakhomov
University of Information Technologies, Mechanics, and Optics
Email: oleg.cryogenics@gmail.com
俄罗斯联邦, Kronverkskii pr. 49, St. Petersburg, 197101
I. Starkov
SIX Research Centre, Department of Radio Electronics
Email: oleg.cryogenics@gmail.com
捷克共和国, Technicka 12, Brno, 61600