Detection of Surface States in Bi2 – xSbxTe3 – ySey Topological Insulators by Magnetotransport Measurements
- 作者: Sizov V.E.1, Borisov V.I.1, Kuznetsov P.I.1, Tkach Y.Y.1
- 
							隶属关系: 
							- Fryazino Branch of Institute of Radioengineering and Electronics, Russian Academy of Science
 
- 期: 卷 61, 编号 2 (2019)
- 页面: 99-102
- 栏目: Semiconductors
- URL: https://journals.rcsi.science/1063-7834/article/view/204783
- DOI: https://doi.org/10.1134/S106378341902029X
- ID: 204783
如何引用文章
详细
In this paper, we studied the effect of the magnetic field and temperature on conductivity of Bi2 ‒ xSbxTe3 – ySey topological insulators of different composition to identify electronic surface states in these films. The experimental data can be explained based on the model with two types of charge carriers. Thermoactivation conductivity, electron or hole, is observed in the film bulk depending on the sample composition while metal-like electronic states are found on the surface. The noticeable contribution of surface topological states to the total conductivity opens up the possibility of studying them.
作者简介
V. Sizov
Fryazino Branch of Institute of Radioengineering and Electronics,Russian Academy of Science
							编辑信件的主要联系方式.
							Email: chmil@ms.ire.rssi.ru
				                					                																			                												                	俄罗斯联邦, 							Moscow, 141190						
V. Borisov
Fryazino Branch of Institute of Radioengineering and Electronics,Russian Academy of Science
														Email: chmil@ms.ire.rssi.ru
				                					                																			                												                	俄罗斯联邦, 							Moscow, 141190						
P. Kuznetsov
Fryazino Branch of Institute of Radioengineering and Electronics,Russian Academy of Science
														Email: chmil@ms.ire.rssi.ru
				                					                																			                												                	俄罗斯联邦, 							Moscow, 141190						
Yu. Tkach
Fryazino Branch of Institute of Radioengineering and Electronics,Russian Academy of Science
														Email: chmil@ms.ire.rssi.ru
				                					                																			                												                	俄罗斯联邦, 							Moscow, 141190						
补充文件
 
				
			 
						 
						 
						 
						 
					 
				 
  
  
  
  
  电邮这篇文章
			电邮这篇文章  开放存取
		                                开放存取 ##reader.subscriptionAccessGranted##
						##reader.subscriptionAccessGranted## 订阅存取
		                                		                                        订阅存取
		                                					