Structural and Thermoelectric Properties of Optically Transparent Thin Films Based on Single-Walled Carbon Nanotubes


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Abstract

Thin films have been produced via a spray method from commercially available single-walled carbon nanotubes (SWCNTs). A SWCNT film thickness has ranged from ~10 to ~80 nm. The SWCNT diameter has accepted values of 1.6–1.8 nm. The existence of SWCNTs longer than 10 μm is established. The optimal thickness of a SWCNT thin film is found to be ~15 nm at which the transmittance exceeds 85%. The specific resistance of SWCNT thin films goes from ~1.5 × 10–3 to ~3 × 10–3 Ohm cm at room temperature. The pioneering study of the temperature dependences of the Seebeck coefficient and surface resistance is performed for this type of SWCNT. A surface resistance is found to increase with rising temperature. Furthermore, the Seebeck coefficient of SWCNT thin films weakly depends on temperature. Its value for all samples is evaluated to be ~40 μV/K. According to the sign of the Seebeck coefficient, thin films exhibit hole-type conductivity. Moreover, the power factor of a 15-nm thin SWCNT-film decreases with a temperature increase to 140◦C from the value of approximately ~120 to ~60 μW m–1 K–2. A further rise in temperature has led to a gain in the power factor.

About the authors

I. A. Tambasov

Institute of Physics, Siberian Branch, Russian Academy of Sciences

Author for correspondence.
Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk

A. S. Voronin

Krasnoyarsk Scientific Center, Siberian Branch, Russian Academy of Sciences

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk

N. P. Evsevskaya

Institute of Chemistry and Chemical Technology, Siberian Branch, Russian Academy of Sciences

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk

M. N. Volochaev

Institute of Physics, Siberian Branch, Russian Academy of Sciences; Siberian State University of Sciences and Technologies

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk; Krasnoyarsk

Yu. V. Fadeev

Siberian Federal University

Email: tambasov_igor@mail.ru
Russian Federation, Krasnoyarsk

A. S. Krylov

Institute of Physics, Siberian Branch, Russian Academy of Sciences

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk

A. S. Aleksandrovskii

Institute of Physics, Siberian Branch, Russian Academy of Sciences; Siberian Federal University

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk; Krasnoyarsk

A. V. Luk’yanenko

Institute of Physics, Siberian Branch, Russian Academy of Sciences; Siberian Federal University

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk; Krasnoyarsk

S. R. Abelyan

Institute of Physics, Siberian Branch, Russian Academy of Sciences

Email: tambasov_igor@mail.ru
Russian Federation, Kransoyarsk

E. V. Tambasova

Siberian State University of Sciences and Technologies

Email: tambasov_igor@mail.ru
Russian Federation, Krasnoyarsk

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