Effect of low electrical potentials on the microhardness of metallic materials
- Authors: Orlova D.V.1,2, Danilov V.I.1,2, Zuev L.B.1,3, Staskevich O.S.3
- 
							Affiliations: 
							- Institute of Strength Physics and Materials Science, Siberian Branch
- National Research Tomsk Polytechnic University
- National Research Tomsk State University
 
- Issue: Vol 58, No 1 (2016)
- Pages: 9-11
- Section: Metals
- URL: https://journals.rcsi.science/1063-7834/article/view/196733
- DOI: https://doi.org/10.1134/S1063783416010248
- ID: 196733
Cite item
Abstract
The effect of low (<5 V) electrical potentials on the microhardness of metallic materials has been studied experimentally. It has been revealed that this effect does depend on the sign of the electric field potential. It has been found that the microhardness of aluminum, cobalt, and zinc decreases and the microhardness of zirconium and iron increases when an electrical potential is applied. It has been argued that the degree of microhardness change under an electric field depends on the magnitude of applied potential, the magnitude of the Hall coefficient of a metal, and its physicochemical properties.
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About the authors
D. V. Orlova
Institute of Strength Physics and Materials Science, Siberian Branch; National Research Tomsk Polytechnic University
							Author for correspondence.
							Email: dvoi@spms.tsc.ru
				                					                																			                												                	Russian Federation, 							Akademicheskii pr. 2/4, Tomsk, 634021; pr. Lenina 30, Tomsk, 634050						
V. I. Danilov
Institute of Strength Physics and Materials Science, Siberian Branch; National Research Tomsk Polytechnic University
														Email: dvoi@spms.tsc.ru
				                					                																			                												                	Russian Federation, 							Akademicheskii pr. 2/4, Tomsk, 634021; pr. Lenina 30, Tomsk, 634050						
L. B. Zuev
Institute of Strength Physics and Materials Science, Siberian Branch; National Research Tomsk State University
														Email: dvoi@spms.tsc.ru
				                					                																			                												                	Russian Federation, 							Akademicheskii pr. 2/4, Tomsk, 634021; pr. Lenina 36, Tomsk, 634050						
O. S. Staskevich
National Research Tomsk State University
														Email: dvoi@spms.tsc.ru
				                					                																			                												                	Russian Federation, 							pr. Lenina 36, Tomsk, 634050						
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