Specific Features of Distribution and Relaxation of Elastic Stresses in Homoepitaxial CVD Films of Germanium and Diamond


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The real structures of epitaxial CVD films of germanium and diamond have been comparatively analyzed. The influence of the specific features of elastic-stress distribution in two-layer structures on the relaxation processes and dislocation distribution are considered. The influence of inhomogeneous (over thickness) plastic deformation, caused by the motion of dislocations under alternating elastic-stress field, on the formation of residual bending of substrates and films is shown by the example of epitaxial germanium structures. A significant difference in the relaxation processes in CVD films of diamond and germanium (crystallographic analog of diamond) is revealed.

作者简介

I. Prokhorov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Russian Academy of Sciences

编辑信件的主要联系方式.
Email: igor.prokhorov@mail.ru
俄罗斯联邦, Moscow, 119333

A. Voloshin

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Russian Academy of Sciences

Email: igor.prokhorov@mail.ru
俄罗斯联邦, Moscow, 119333

D. Romanov

Bauman Moscow State Technical University, Kaluga Branch

Email: igor.prokhorov@mail.ru
俄罗斯联邦, Kaluga, 248004

A. Bolshakov

Prokhorov General Physics Institute, Russian Academy of Sciences; National Research Nuclear University MEPhI

Email: igor.prokhorov@mail.ru
俄罗斯联邦, Moscow, 119991; Moscow, 115409

V. Ralchenko

Prokhorov General Physics Institute, Russian Academy of Sciences; National Research Nuclear University MEPhI

Email: igor.prokhorov@mail.ru
俄罗斯联邦, Moscow, 119991; Moscow, 115409

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