Отправить статью по E-mail Study of the specific features of single-crystal boron microstructure
- Авторы: Blagov A.E.1,2, Vasil’ev A.L.1,2, Dmitriev V.P.3, Ivanova A.G.1, Kulikov A.G.1,2, Marchenkov N.V.1,2, Popov P.A.4, Presnyakov M.Y.2, Prosekov P.A.1,2, Pisarevskii Y.V.1,2, Targonskii A.V.1,2, Chernaya T.S.1, Chernyshov D.Y.3
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Учреждения:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
- National Research Centre “Kurchatov Institute”
- Swiss–Norwegian Beamlines at the European Synchrotron Radiation Facility
- Bryansk State University
- Выпуск: Том 62, № 5 (2017)
- Страницы: 692-702
- Раздел: Diffraction and Scattering of Ionizing Radiations
- URL: https://journals.rcsi.science/1063-7745/article/view/191270
- DOI: https://doi.org/10.1134/S1063774517050030
- ID: 191270
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Аннотация
A complex study of the structure of β-boron single crystal grown by the floating-zone method, with sizes significantly exceeding the analogs known in the literature, has been performed. The study includes X-ray diffraction analysis and X-ray diffractometry (measurement of pole figures and rocking curves), performed on both laboratory and synchrotron sources; atomic-resolution scanning transmission electron microscopy with spherical aberration correction; and energy-dispersive microanalysis. X-ray diffraction analysis using synchrotron radiation has been used to refine the β-boron structure and find impurity Si atoms. The relative variations in the unit-cell parameters a and c for the crystal bulk are found to be δa/a ≈ 0.4 and δc/c ≈ 0.1%. X-ray diffractometry has revealed that the single-crystal growth axis coincides with the [\(2\bar 2013\)] crystallographic axis and makes an angle of 21.12° with the [0001] threefold axis. Electron microscopy data have confirmed that the sample under study is a β-boron crystal, which may contain 0.3–0.4 at % Si as an impurity. Planar defects (stacking faults and dislocations) are found. The results of additional measurements of the temperature dependence of the thermal conductivity of the crystal in the range of 50–300 K are indicative of its high structural quality.
Об авторах
A. Blagov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
A. Vasil’ev
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
V. Dmitriev
Swiss–Norwegian Beamlines at the European Synchrotron Radiation Facility
Email: marchenkov_nv@nrcki.ru
Франция, Grenoble
A. Ivanova
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333
A. Kulikov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
N. Marchenkov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Автор, ответственный за переписку.
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
P. Popov
Bryansk State University
Email: marchenkov_nv@nrcki.ru
Россия, Bryansk, 241036
M. Presnyakov
National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 123182
P. Prosekov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
Yu. Pisarevskii
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
A. Targonskii
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”; National Research Centre “Kurchatov Institute”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333; Moscow, 123182
T. Chernaya
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”
Email: marchenkov_nv@nrcki.ru
Россия, Moscow, 119333
D. Chernyshov
Swiss–Norwegian Beamlines at the European Synchrotron Radiation Facility
Email: marchenkov_nv@nrcki.ru
Франция, Grenoble
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