Calibration of CryojetHT and Cobra Plus Cryosystems used in X-ray diffraction studies
- Авторлар: Dudka A.P.1, Verin I.A.1, Smirnova E.S.1
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Мекемелер:
- Shubnikov Institute of Crystallography
- Шығарылым: Том 61, № 4 (2016)
- Беттер: 692-696
- Бөлім: Apparatus
- URL: https://journals.rcsi.science/1063-7745/article/view/190227
- DOI: https://doi.org/10.1134/S1063774516040052
- ID: 190227
Дәйексөз келтіру
Аннотация
CryoJetHT (Oxford Instruments) and Cobra Plus (Oxford Cryosystems) cryosystems, which are used for sample cooling in X-ray diffraction experiments, have been calibrated. It is shown that the real temperature in the vicinity of the sample differs significantly (the deviation is as high as 8–10 K at low temperatures) from the temperature recorded by authorized sensors of these systems. The calibration results are confirmed by measurements of the unit-cell parameters of GdFe3(BO3)4 single crystal in the temperature range of its phase transition. It is shown that, to determine the real temperature of a sample, one must perform an independent calibration of cryosystems rather than rely on their ratings.
Авторлар туралы
A. Dudka
Shubnikov Institute of Crystallography
Хат алмасуға жауапты Автор.
Email: dudka@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333
I. Verin
Shubnikov Institute of Crystallography
Email: dudka@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333
E. Smirnova
Shubnikov Institute of Crystallography
Email: dudka@crys.ras.ru
Ресей, Leninskii pr. 59, Moscow, 119333
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