New Structure for Photoconductive Antennas Based on {LTG-GaAs/GaAs:Si} Superlattice on GaAs(111)A Substrate
- Autores: Trunkin I.N.1, Vasiliev A.L.1,2, Vasil’evskii I.S.3, Vinichenko A.N.3, Klimov E.A.4, Klochkov A.N.4, Maltsev P.P.4, Pushkarev S.S.4, Galiev G.B.4
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Afiliações:
- National Research Centre “Kurchatov Institute”
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences
- National Research Nuclear University “MEPhI”
- V.G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics, Russian Academy of Sciences
- Edição: Volume 64, Nº 2 (2019)
- Páginas: 205-211
- Seção: Real Structure of Crystals
- URL: https://journals.rcsi.science/1063-7745/article/view/193755
- DOI: https://doi.org/10.1134/S1063774519020111
- ID: 193755
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Resumo
The structural characteristics of a new structure for photoconductive antennas have been investigated. This structure is a multilayered epitaxial film grown on a GaAs(111)A substrate; it consists of alternating undoped low-temperature grown GaAs (LTG-GaAs) layers and GaAs layers synthesized in the standard high-temperature regime and doped with silicon (GaAs:Si). The As4/Ga flow ratio γ is chosen such as to produce p-type GaAs:Si layers. LTG-GaAs layers were grown at an enlarged γ value. The samples grown on GaAs(100) substrates were single-crystal, whereas the single-crystal growth on GaAs(111)A substrates changed to polycrystalline when the film thickness reached 320–340 nm. The sizes of As precipitates in annealed samples, their distribution over the film thickness, and specific features of their crystal structure have been analyzed.
Sobre autores
I. Trunkin
National Research Centre “Kurchatov Institute”
Email: serp456207@gmail.com
Rússia, Moscow, 123182
A. Vasiliev
National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”Russian Academy of Sciences
Email: serp456207@gmail.com
Rússia, Moscow, 123182; Moscow, 119333
I. Vasil’evskii
National Research Nuclear University “MEPhI”
Email: serp456207@gmail.com
Rússia, Moscow, 115409
A. Vinichenko
National Research Nuclear University “MEPhI”
Email: serp456207@gmail.com
Rússia, Moscow, 115409
E. Klimov
V.G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics, Russian Academy of Sciences
Email: serp456207@gmail.com
Rússia,
Moscow, 117105
A. Klochkov
V.G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics, Russian Academy of Sciences
Email: serp456207@gmail.com
Rússia,
Moscow, 117105
P. Maltsev
V.G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics, Russian Academy of Sciences
Email: serp456207@gmail.com
Rússia,
Moscow, 117105
S. Pushkarev
V.G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics, Russian Academy of Sciences
Autor responsável pela correspondência
Email: serp456207@gmail.com
Rússia,
Moscow, 117105
G. Galiev
V.G. Mokerov Institute of Ultra High Frequency Semiconductor Electronics, Russian Academy of Sciences
Email: serp456207@gmail.com
Rússia,
Moscow, 117105
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