Structuring Copper in the Plasma Medium of a High-Frequency Discharge
- Авторы: Dunaev A.1, Murin D.1
-
Учреждения:
- Ivanovo State University of Chemical Technology
- Выпуск: Том 47, № 4 (2018)
- Страницы: 234-238
- Раздел: Article
- URL: https://journals.rcsi.science/1063-7397/article/view/186850
- DOI: https://doi.org/10.1134/S1063739718040029
- ID: 186850
Цитировать
Аннотация
Currently, copper is a priority material for the formation of interelement connections and distributions in silicon ICs. In addition, copper is widely used to create flexible printed circuit boards and multilayer hybrid ICs. We used freon R-12 (CCl2F2) as a plasma-forming medium for etching copper in this work. Freon R-12 plays an important role in the plasma etching industry by providing the technological parameters required in the process. In this article, an experimental study has been carried out of the features of the interaction of the copper surface with freon R-12, as well as the influence of the treatment time and external plasma parameters (temperature, displacement power, consumption power, gas pressure) on the quality of the near-surface copper layer.
Об авторах
A. Dunaev
Ivanovo State University of Chemical Technology
Автор, ответственный за переписку.
Email: dunaev-80@mail.ru
Россия, Ivanovo, 153000
D. Murin
Ivanovo State University of Chemical Technology
Email: dunaev-80@mail.ru
Россия, Ivanovo, 153000