The effect of size of the SiC inclusions in the AlN–SiC composite structure on its electrophysical properties
- Autores: Serbenyuk T.B.1, Prikhna T.O.1, Sverdun V.B.1, Chasnyk V.I.2, Kovylyaev V.V.3, Dellith J.4, Moshchil’ V.E.1, Shapovalov A.P.1, Marchenko A.A.1, Polikarpova L.O.1
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Afiliações:
- Bakul Institute for Superhard Materials
- Frantsevich Institute for Materials Science Problems
- State enterprise Orion Research Institute
- Leibniz Institute of Photonic Technology
- Edição: Volume 38, Nº 4 (2016)
- Páginas: 241-250
- Seção: Production, Structure, Properties
- URL: https://journals.rcsi.science/1063-4576/article/view/185604
- DOI: https://doi.org/10.3103/S1063457616040043
- ID: 185604
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Resumo
AlN–SiC–Y3Al5O12 composite materials with a high absorption of microwave frequency (27–65 dB/cm) produced by pressureless sintering of mixtures consisting of AlN(2H), Y2O3, and SiC (6H) in 46, 4, 50 wt %, respectively, have been studied. The SiC components of the mixtures were used in sizes of 1, 5, and 50 μm. It has been shown that the resistivity of the developed materials depends essentially on the materials structures: sizes of SiC inclusions, distances between them, and state of the interfaces. It has been found that the increase of the SiC inclusions sizes in the material structure from 3 to 7 μm results in the decrease of the resistivity from 104 to 90 Ω·m, and at the decrease of the SiC inclusions sizes from 3 to 0.5 μm there forms a SiC uninterrupted skeleton, which also decreases the resistivity to 210 Ω·m. Thus, composite materials that contain 50 wt % SiC (inclusions sizes of 3 μm) are the most efficient in producing absorbers of microwave radiation. Interlayers of yttrium aluminum garnet, which are located at the SiC grains boundaries, prevent the forming of AlN(2H)–SiC(6H) solid solutions and thus, make it possible to keep high dielectric characteristics of a composite material based on aluminum nitride and afford a high absorption of a microwave radiation.
Sobre autores
T. Serbenyuk
Bakul Institute for Superhard Materials
Autor responsável pela correspondência
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
T. Prikhna
Bakul Institute for Superhard Materials
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
V. Sverdun
Bakul Institute for Superhard Materials
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
V. Chasnyk
Frantsevich Institute for Materials Science Problems
Email: serbenuk@ukr.net
Ucrânia, vul. Krzhizhanivs’kogo 3, Kiev, 03680
V. Kovylyaev
State enterprise Orion Research Institute
Email: serbenuk@ukr.net
Ucrânia, Kiev
J. Dellith
Leibniz Institute of Photonic Technology
Email: serbenuk@ukr.net
Alemanha, Albert Einstein Strasse 9, Jena, D07745
V. Moshchil’
Bakul Institute for Superhard Materials
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
A. Shapovalov
Bakul Institute for Superhard Materials
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
A. Marchenko
Bakul Institute for Superhard Materials
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
L. Polikarpova
Bakul Institute for Superhard Materials
Email: serbenuk@ukr.net
Ucrânia, vul. Avtozavods’ka 2, Kiev, 04074
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