Effect of temperature and grain size on the stability of the microstructure of Ag films during annealing
- Авторлар: Sursaeva V.G.1
-
Мекемелер:
- Institute of Solid State Physics
- Шығарылым: Том 80, № 10 (2016)
- Беттер: 1287-1289
- Бөлім: Proceedings of the VI International Conference “Crystal Physics and the Deformation Behavior of Promising Materials”
- URL: https://journals.rcsi.science/1062-8738/article/view/184859
- DOI: https://doi.org/10.3103/S1062873816100191
- ID: 184859
Дәйексөз келтіру
Аннотация
Grain growth in thin silver films is investigated experimentally. It is shown that the duration of the incubation period preceding linear or parabolic grain growth depends on the annealing temperature and average grain size. It is found that the lower the isothermal annealing temperature and the smaller the grain size, the longer the period of incubation, i.e., the longer the period of microstructure stability.
Авторлар туралы
V. Sursaeva
Institute of Solid State Physics
Хат алмасуға жауапты Автор.
Email: sursaeva@issp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432
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