Effect of temperature and grain size on the stability of the microstructure of Ag films during annealing

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Abstract

Grain growth in thin silver films is investigated experimentally. It is shown that the duration of the incubation period preceding linear or parabolic grain growth depends on the annealing temperature and average grain size. It is found that the lower the isothermal annealing temperature and the smaller the grain size, the longer the period of incubation, i.e., the longer the period of microstructure stability.

About the authors

V. G. Sursaeva

Institute of Solid State Physics

Author for correspondence.
Email: sursaeva@issp.ac.ru
Russian Federation, Chernogolovka, Moscow oblast, 142432

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