Experimental Study of Radiation-Induced Evaporation of Cesium Iodide on VEPP-3 Synchrotron Radiation Source

Abstract

The thickness and structure of scintillation screens are of paramount importance in X-ray microscopy. A scintillator should be fairly thick in order to maximize the conversion of X-ray quanta to the visible range. At the same time, scattering of light in scintillators considerably reduces the spatial resolution of X-ray images. To improve resolution, the CsI:Tl layer can be structured as a matrix of micropixels to inhibit the spread of light to neighboring cells. In this work, radiation-induced ablation of CsI:Tl with the use of synchrotron radiation is examined as a new way of structuring for scintillation screens.