Multilayer X-Ray Image-Forming Optics

Abstract

An overview is presented of the current state of research underway at the Institute for the Physics of Microstructures in the field of multilayered X-ray imaging optics. New ways of studying the surfaces of mirror substrates and aberrations of optical systems are described, along with the ion-beam technology of super-polishing, aspherization, and correcting local errors in shape. The development of new diagnostic methods is described, as are the obtained record reflection coefficients of multilayer interference mirrors based on beryllium.