Email this article Resolving and Estimating Signal Parameters in Infrared, Raman, and Terahertz Spectrometers and Other Analytical Tools
- Authors: Rozhentsov A.A.1, Baev A.A.1, Gromyko D.S.1
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Affiliations:
- Volga State University of Technology
- Issue: Vol 82, No 12 (2018)
- Pages: 1518-1521
- Section: Article
- URL: https://journals.rcsi.science/1062-8738/article/view/186894
- DOI: https://doi.org/10.3103/S1062873818120183
- ID: 186894
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Abstract
Principles of signal formation in analytical devices are considered. The similarity between requirements for signal processing systems is shown. Approaches are proposed that ensure the processing of overlapping peaks of a signal due to the use of original means of resolving and estimating the parameters of closely spaced peaks. The effectiveness of the proposed techniques and those used in analytical equipment is compared.
About the authors
A. A. Rozhentsov
Volga State University of Technology
Author for correspondence.
Email: RozhencovAA@volgatech.net
Russian Federation, Yoshkar-Ola, Republic of Mari El, 424000
A. A. Baev
Volga State University of Technology
Email: RozhencovAA@volgatech.net
Russian Federation, Yoshkar-Ola, Republic of Mari El, 424000
D. S. Gromyko
Volga State University of Technology
Email: RozhencovAA@volgatech.net
Russian Federation, Yoshkar-Ola, Republic of Mari El, 424000
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