Resolving and Estimating Signal Parameters in Infrared, Raman, and Terahertz Spectrometers and Other Analytical Tools

Resumo

Principles of signal formation in analytical devices are considered. The similarity between requirements for signal processing systems is shown. Approaches are proposed that ensure the processing of overlapping peaks of a signal due to the use of original means of resolving and estimating the parameters of closely spaced peaks. The effectiveness of the proposed techniques and those used in analytical equipment is compared.