Analytical features of the SIMS method in studying the composition of quartz concentrates

Autores: Volkov S.S.¹^,2, Kitaeva T.I.²
Afiliações:
1. Ryazan Higher Airborne School (Military Institute)
2. Ryazan State Radio Engineering University
Edição: Volume 80, Nº 2 (2016)
Páginas: 129-132
Seção: Proceedings of the 22nd International Conference “Ion-Surface Interaction (ISI-2015)”
URL: https://journals.rcsi.science/1062-8738/article/view/183805
DOI: https://doi.org/10.3103/S1062873816020295
ID: 183805

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Somente assinantes

Ionic yields from different impurities of pure quartz concentrates are investigated.

Ionic Yield, Layer Analysis, Quartz Concentrate, Dark Particle, Concentration Depth Profile

Ryazan Higher Airborne School (Military Institute); Ryazan State Radio Engineering University

Email: kitaeva_46@mail.ru
Rússia, Ryazan, 390000; Ryazan, 390035

Ryazan State Radio Engineering University

Autor responsável pela correspondência
Email: kitaeva_46@mail.ru
Rússia, Ryazan, 390035

Ação

1. JATS XML