Analytical features of the SIMS method in studying the composition of quartz concentrates

Authors: Volkov S.S.¹^,2, Kitaeva T.I.²
Affiliations:
1. Ryazan Higher Airborne School (Military Institute)
2. Ryazan State Radio Engineering University
Issue: Vol 80, No 2 (2016)
Pages: 129-132
Section: Proceedings of the 22nd International Conference “Ion-Surface Interaction (ISI-2015)”
URL: https://journals.rcsi.science/1062-8738/article/view/183805
DOI: https://doi.org/10.3103/S1062873816020295
ID: 183805

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Ionic yields from different impurities of pure quartz concentrates are investigated.

Ionic Yield, Layer Analysis, Quartz Concentrate, Dark Particle, Concentration Depth Profile

Ryazan Higher Airborne School (Military Institute); Ryazan State Radio Engineering University

Email: kitaeva_46@mail.ru
Russian Federation, Ryazan, 390000; Ryazan, 390035

Ryazan State Radio Engineering University

Author for correspondence.
Email: kitaeva_46@mail.ru
Russian Federation, Ryazan, 390035

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