A Study of Novel Organic Optoelectronics Materials Based on Thiophene and Silicon by Time-of-Flight Laser Desorption/Ionization Mass Spectrometry
- Authors: Pleshkova A.P.1, Kuznetsova E.S.2
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Affiliations:
- Institute of Organoelement Compounds, Russian Academy of Sciences
- Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences
- Issue: Vol 73, No 13 (2018)
- Pages: 1292-1300
- Section: Articles
- URL: https://journals.rcsi.science/1061-9348/article/view/182916
- DOI: https://doi.org/10.1134/S1061934818130129
- ID: 182916
Cite item
Abstract
The results of investigation of a variety of new organic semiconductors for optoelectronics based on thiophene and silicon by time-of-flight direct laser desorption/ionization mass spectrometry are presented. The peculiarities of the behavior of these species are analyzed. The main ionization route for many of the compounds was found to be the only formation of a molecular radical cation. For a small group of species, protonation and deprotonation were observed rather than the above path. However, there are some molecules for which several competing routes were detected, namely, the formation of a molecular radical cation, protonation, and deprotonation
About the authors
A. P. Pleshkova
Institute of Organoelement Compounds, Russian Academy of Sciences
Author for correspondence.
Email: apple@ineos.ac.ru
Russian Federation, Moscow, 119991
E. S. Kuznetsova
Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences
Email: apple@ineos.ac.ru
Russian Federation, Moscow, 119991