System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures
- Autores: Shcherbinin S.1,2, Volchkov S.1, Lepalovskii V.1, Chlenova A.1, Kurlyandskaya G.1
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Afiliações:
- Ural Federal University
- Institute of Electrophysics, Ural Branch
- Edição: Volume 53, Nº 3 (2017)
- Páginas: 204-212
- Seção: Magnetic Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181305
- DOI: https://doi.org/10.1134/S1061830917030093
- ID: 181305
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Resumo
Thin magnetic films and multilayers are widely used in electronic devices and sensor systems, including systems for magnetic nondestructive testing and magnetic biodetection. Creating sensing elements of a new generation will necessitate the certification of film nanostructures. In this paper, a novel system is presented that allows automated measurement of parameters of thin ferromagnetic film structures at frequencies of 0.1 to 25 GHz in a magnetic field of up to 18 kOe.
Sobre autores
S. Shcherbinin
Ural Federal University; Institute of Electrophysics, Ural Branch
Autor responsável pela correspondência
Email: scher@iep.uran.ru
Rússia, Yekaterinburg, 620002; Ekaterinburg, 620016
S. Volchkov
Ural Federal University
Email: scher@iep.uran.ru
Rússia, Yekaterinburg, 620002
V. Lepalovskii
Ural Federal University
Email: scher@iep.uran.ru
Rússia, Yekaterinburg, 620002
A. Chlenova
Ural Federal University
Email: scher@iep.uran.ru
Rússia, Yekaterinburg, 620002
G. Kurlyandskaya
Ural Federal University
Email: scher@iep.uran.ru
Rússia, Yekaterinburg, 620002