Email this article System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures
- Authors: Shcherbinin S.V.1,2, Volchkov S.O.1, Lepalovskii V.N.1, Chlenova A.A.1, Kurlyandskaya G.V.1
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Affiliations:
- Ural Federal University
- Institute of Electrophysics, Ural Branch
- Issue: Vol 53, No 3 (2017)
- Pages: 204-212
- Section: Magnetic Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181305
- DOI: https://doi.org/10.1134/S1061830917030093
- ID: 181305
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Abstract
Thin magnetic films and multilayers are widely used in electronic devices and sensor systems, including systems for magnetic nondestructive testing and magnetic biodetection. Creating sensing elements of a new generation will necessitate the certification of film nanostructures. In this paper, a novel system is presented that allows automated measurement of parameters of thin ferromagnetic film structures at frequencies of 0.1 to 25 GHz in a magnetic field of up to 18 kOe.
About the authors
S. V. Shcherbinin
Ural Federal University; Institute of Electrophysics, Ural Branch
Author for correspondence.
Email: scher@iep.uran.ru
Russian Federation, Yekaterinburg, 620002; Ekaterinburg, 620016
S. O. Volchkov
Ural Federal University
Email: scher@iep.uran.ru
Russian Federation, Yekaterinburg, 620002
V. N. Lepalovskii
Ural Federal University
Email: scher@iep.uran.ru
Russian Federation, Yekaterinburg, 620002
A. A. Chlenova
Ural Federal University
Email: scher@iep.uran.ru
Russian Federation, Yekaterinburg, 620002
G. V. Kurlyandskaya
Ural Federal University
Email: scher@iep.uran.ru
Russian Federation, Yekaterinburg, 620002
