System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures

Abstract

Thin magnetic films and multilayers are widely used in electronic devices and sensor systems, including systems for magnetic nondestructive testing and magnetic biodetection. Creating sensing elements of a new generation will necessitate the certification of film nanostructures. In this paper, a novel system is presented that allows automated measurement of parameters of thin ferromagnetic film structures at frequencies of 0.1 to 25 GHz in a magnetic field of up to 18 kOe.