An instrument for simultaneous visual and thermal testing of microelectronic devices


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The problem of simultaneous visual and thermal testing of microobjects is considered. For this purpose, a mirror–lens optical system is proposed and constructed. The system has no movable elements and provides identical scales of images in spectral ranges of 0.4–0.8 and 8–14 μm. The technique for calculating its dimensions and an experimental setup on the basis of this scheme are described. The results of its testing using an example of investigating microelectronic devices are presented.

作者简介

A. Machikhin

Moscow Power Engineering Institute (Technical University)

编辑信件的主要联系方式.
Email: aalexanderr@mail.ru
俄罗斯联邦, ul. Krasnokazarmennaya 14, Moscow, 111250

V. Batshev

Bauman State Technical University

Email: aalexanderr@mail.ru
俄罗斯联邦, Vtoraya Baumanskaya ul. 5, Moscow, 105005

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