An instrument for simultaneous visual and thermal testing of microelectronic devices
- 作者: Machikhin A.S.1, Batshev V.I.2
-
隶属关系:
- Moscow Power Engineering Institute (Technical University)
- Bauman State Technical University
- 期: 卷 52, 编号 2 (2016)
- 页面: 112-117
- 栏目: Integrated Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181106
- DOI: https://doi.org/10.1134/S1061830916020042
- ID: 181106
如何引用文章
详细
The problem of simultaneous visual and thermal testing of microobjects is considered. For this purpose, a mirror–lens optical system is proposed and constructed. The system has no movable elements and provides identical scales of images in spectral ranges of 0.4–0.8 and 8–14 μm. The technique for calculating its dimensions and an experimental setup on the basis of this scheme are described. The results of its testing using an example of investigating microelectronic devices are presented.
作者简介
A. Machikhin
Moscow Power Engineering Institute (Technical University)
编辑信件的主要联系方式.
Email: aalexanderr@mail.ru
俄罗斯联邦, ul. Krasnokazarmennaya 14, Moscow, 111250
V. Batshev
Bauman State Technical University
Email: aalexanderr@mail.ru
俄罗斯联邦, Vtoraya Baumanskaya ul. 5, Moscow, 105005
补充文件
