Enviar artigo por via de e-mail Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method
- Autores: Lopushenko V.V.1
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Afiliações:
- Faculty of Computational Mathematics and Cybernetics, Moscow State University
- Edição: Volume 28, Nº 1 (2017)
- Páginas: 60-73
- Seção: Article
- URL: https://journals.rcsi.science/1046-283X/article/view/247562
- DOI: https://doi.org/10.1007/s10598-016-9345-y
- ID: 247562
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Resumo
The spectral-domain volume integral equation is used to develop a computer model for investigating the scattering properties of plane objects in the form of elliptical cylinders embedded in a dielectric wafer. The features of the model are demonstrated for particles of different materials and different shapes.
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Sobre autores
V. Lopushenko
Faculty of Computational Mathematics and Cybernetics, Moscow State University
Autor responsável pela correspondência
Email: lopushnk@cs.msu.ru
Rússia, Moscow
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