Email this article Single Fault Diagnostic Tests for Inversion Faults of Circuit Elements Over Some Bases
- Authors: Lyubich I.G.1, Romanov D.S.1
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Affiliations:
- Lomonosov Moscow State University
- Issue: Vol 30, No 1 (2019)
- Pages: 36-47
- Section: Article
- URL: https://journals.rcsi.science/1046-283X/article/view/247823
- DOI: https://doi.org/10.1007/s10598-019-09432-3
- ID: 247823
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Abstract
The article shows that, in a number of bases, every Boolean function can be realized by an irredundant combinational circuit that admits a single fault diagnostic test of length not greater than 4 with respect to inversion faults on the element outputs.
About the authors
I. G. Lyubich
Lomonosov Moscow State University
Author for correspondence.
Email: lubi4ig@gmail.com
Russian Federation, Moscow
D. S. Romanov
Lomonosov Moscow State University
Email: lubi4ig@gmail.com
Russian Federation, Moscow
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