Poverhnostʹ. Rentgenovskie, sinhrotronnye i nejtronnye issledovaniâ
ISSN 1028-0960 (Print)
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X-ray diffraction
X-ray diffraction analysis
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
deformation
dislocations
electron microscopy
irradiation
magnetron sputtering
microstructure
nanoparticles
optical properties
phase composition
scanning electron microscopy
scanning probe microscopy
structure
surface
surface morphology
synchrotron radiation
zinc oxide
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X-ray diffraction
X-ray diffraction analysis
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
deformation
dislocations
electron microscopy
irradiation
magnetron sputtering
microstructure
nanoparticles
optical properties
phase composition
scanning electron microscopy
scanning probe microscopy
structure
surface
surface morphology
synchrotron radiation
zinc oxide
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Author Details
Author Details
Karasev, K.
Issue
Section
Title
File
No 1 (2023)
Articles
Molecular Dynamic Simulation of Silicon Irradiation with 2–8 keV Buckminsterfullerene C
60
Ions
No 4 (2024)
Articles
Modeling of silicon irradiation with C
60
ions and the role of the interaction potential
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