Changes in the optical properties of coatings based on hollow ZnO/SiO2 particles under electron irradiation

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Abstract

A comparative analysis of the diffuse reflectance spectra and their changes after irradiation with electrons with an energy of 30 keV of coatings based on polymethylphenylsiloxane resin and pigment powders of two-layer hollow ZnO/SiO2 particles was carried out. The analysis was carried out in situ in the range 250–2500 nm. The samples were irradiated in a “Spectrum” space simulator. The radiation resistance of the studied coatings based on two-layer hollow ZnO/SiO2 particles was estimated relative to coatings based on ZnO polycrystals by analyzing the difference diffuse reflectance spectra obtained by subtracting the spectra after irradiation from the spectra of unirradiated samples. It has been found that the intensity of the induced absorption bands in coatings based on hollow ZnO/SiO2 particles is less than in coatings based on ZnO microparticles, and the radiation resistance when estimating changes in the integral absorption coefficient of solar radiation (ΔαS) is twice as high. The increase in radiation resistance is probably determined by the different nature of defect accumulation: in the case of solid microparticles, defects can accumulate inside grains; in hollow particles, the accumulation of defects can occur only within the thin shell of the sphere.

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About the authors

A. N. Dudin

Аmur State University

Email: viktoriay-09@mail.ru
Russian Federation, 675027, Blagoveshchensk

V. Yu. Yurina

Аmur State University

Author for correspondence.
Email: viktoriay-09@mail.ru
Russian Federation, 675027, Blagoveshchensk

V. V. Neshchimenko

Аmur State University

Email: viktoriay-09@mail.ru
Russian Federation, 675027, Blagoveshchensk

M. M. Mikhailov

Аmur State University; Tomsk State University of Control Systems and Radioelectronics

Email: viktoriay-09@mail.ru
Russian Federation, 675027, Blagoveshchensk; 634050, Tomsk

S. A. Yuriev

Аmur State University; Tomsk State University of Control Systems and Radioelectronics

Email: viktoriay-09@mail.ru
Russian Federation, 675027, Blagoveshchensk; 634050, Tomsk

A. N. Lapin

Tomsk State University of Control Systems and Radioelectronics

Email: viktoriay-09@mail.ru
Russian Federation, 634050, Tomsk

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Supplementary files

Supplementary Files
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1. JATS XML
2. Fig. 1. Diffuse reflectance spectra of coatings based on organosilicon varnish and hollow two-layer ZnO/SiO2 particles (1), bulk ZnO microparticles (2), without pigments (3).

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3. Fig. 2. Difference spectra of diffuse reflectance obtained by subtracting the spectra of organosilicon varnish from the spectra of hollow bilayer ZnO/SiO2 particles (1) and bulk ZnO microparticles (2).

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4. Fig. 3. Difference spectra of diffuse reflectance of coatings based on bulk ZnO microparticles after irradiation with accelerated electrons with an energy of 30 keV, fluence: 5 × 1015 (1); 1 × 1016 (2); 2 × 1016 (3); 3 × 1016 (4); 5 × 1016 (5); 7 × 1016 cm–2 (6).

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5. Fig. 4. Difference spectra of diffuse reflectance of coatings based on hollow bilayer ZnO/SiO2 particles after irradiation with accelerated electrons with an energy of 30 keV, fluence: 5 × 1015 (1); 1 × 1016 (2); 2 × 1016 (3); 3 × 1016 (4); 5 × 1016 (5); 7 × 1016 cm–2 (6).

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6. Fig. 5. Dependence of changes in the absorption coefficient ΔαS after irradiation with electrons with an energy of 30 keV (fluence up to 7 × 1016 cm–2) of coatings based on organosilicon varnish and hollow two-layer ZnO/SiO2 particles (1) and bulk ZnO microparticles (2).

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7. Fig. 6. Simulation of the passage of an electron beam through a composite based on polymethylphenylsiloxane resin and bulk ZnO microparticles (a) and hollow ZnO/SiO2 microparticles (b).

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