The Extension of Field of Applications of Atomic-Force Microscope Hybrid Mode of Two-Probes Nano-Manipulator

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The review of extension of fields of applications of hybrid mode of atomic-force microscope. This mode is the main for two-probes AFM-manipulator. Various methods of upgrades of the feed back system of the AFM whose essentially improve the signal-to-noise ratio in topography mapping are presented. Additionally, successful application of wide range of probes the flexible ones such as standard W probes and glass capillaries as well as rigid probes (sapphire probes with probe tips diameters of dozens of microns) are presented as well. We show the examples of wide application of such mode in measurements of conductivity and adhesion forces of the nanowhiskers on the Si substrate. Beside this, the application of hybrid mode in micro- and nanofluidics such as formation of drops of defined volumes, replacement of drops, their devision and merging are presented. The example of different techniques of manipulations are presented. The possibility of nanowhiskers replacement with liquid flow formed by AFM-probe, i.e. avoiding the direct tip-to-nanowhisker contact, are shown.

作者简介

A. Zhukov

Institute of Solid State Physics RAS

编辑信件的主要联系方式.
Email: azhukov@issp.ac.ru
Russia, 142432, Chernogolovka

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