Atomic Structure Probing of Thin Metal Films via Vacuum Holographic Microscopy
- Авторлар: Egorov N.V.1, Antonova L.I.1, Trofimov V.V.1, Gileva A.Y.1
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Мекемелер:
- Saint-Petersburg State University
- Шығарылым: Том 13, № 6 (2019)
- Беттер: 1267-1271
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196580
- DOI: https://doi.org/10.1134/S1027451019060284
- ID: 196580
Дәйексөз келтіру
Аннотация
A vacuum holographic microscope is designed to probe the atomic structure of thin metal films. The experimental setup is based on the use of a source of a monochromatic low-energy electron beam induced by a tip cathode spaced from the sample at a distance of several tens of nanometers. The visual resolution of atoms of the object requires a microscope magnification of at least 105, which necessitates high-accuracy movement of the electron source. The parameters of principal nodes of the microscope, which are responsible for the generation and recording of useful signals, are studied and optimized, as well.
Авторлар туралы
N. Egorov
Saint-Petersburg State University
Хат алмасуға жауапты Автор.
Email: n.v.egorov@spbu.ru
Ресей, St. Petersburg, 199034
L. Antonova
Saint-Petersburg State University
Email: v.v.trofimov@spbu.ru
Ресей, St. Petersburg, 199034
V. Trofimov
Saint-Petersburg State University
Хат алмасуға жауапты Автор.
Email: v.v.trofimov@spbu.ru
Ресей, St. Petersburg, 199034
A. Gileva
Saint-Petersburg State University
Email: v.v.trofimov@spbu.ru
Ресей, St. Petersburg, 199034
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