Excitation Energies of VnOm+ and NbnOm+ Clusters Sputtered under Ion Bombardment


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The decay of VnOm+ and NbnOm+ clusters sputtered under bombardment of the surfaces of vanadium and niobium with Xe+ ions and oxygen inflow is investigated by secondary-ion mass spectrometry. Based on experimental data, the excitation energy is calculated within the framework of the theory of unimolecular reactions. It is demonstrated that the numerical values of the specific excitation energy of VnOm+ and NbnOm+ within the accuracy of the procedure do not depend significantly on the number of atoms that make up the clusters, nor on their type.

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N. Dzhemilev

Institute of Ion-Plasma and Laser Technologies

Email: maksimov_s@yahoo.com
乌兹别克斯坦, Tashkent, 100125

S. Kovalenko

Institute of Ion-Plasma and Laser Technologies

Email: maksimov_s@yahoo.com
乌兹别克斯坦, Tashkent, 100125

S. Maksimov

Institute of Ion-Plasma and Laser Technologies

编辑信件的主要联系方式.
Email: maksimov_s@yahoo.com
乌兹别克斯坦, Tashkent, 100125

O. Tukfatullin

Institute of Ion-Plasma and Laser Technologies

Email: maksimov_s@yahoo.com
乌兹别克斯坦, Tashkent, 100125

Sh. Khojiev

Institute of Ion-Plasma and Laser Technologies

Email: maksimov_s@yahoo.com
乌兹别克斯坦, Tashkent, 100125

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