Ultraviolet sensitization of high-energy heavy-ion tracks in polyethylene terephthalate


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The reasons underlying the selective acceleration of the etching of heavy-ion tracks in polyethylene terephthalate irradiated by ultraviolet radiation (UV) are examined. The use of high-performance liquid chromatography, atomic-force microscopy, and infrared (IR) spectroscopy enable us to ascertain that etching is accelerated mainly due to the photodestruction of radiolysis products, which leads to the formation of an additional amount of low-molecular products with carboxyl groups in the region of tracks, thereby ultimately accelerating the polymer-etching process.

作者简介

A. Vilensky

Federal Scientific-Research Centre Crystallography and Photonics

编辑信件的主要联系方式.
Email: vilensk@mail.ru
俄罗斯联邦, Moscow, 119333

K. Sabbatovsky

Frumkin Institute of Physical Chemistry and Electrochemistry

Email: vilensk@mail.ru
俄罗斯联邦, Moscow, 119071

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