Development of a Broadband Double Monochromator based on Multilayer Supermirrors for Hard X-Ray Spectroscopy on High-Intensity Beams

Аннотация

This work focuses on multilayer monochromatization systems (MMS) designed for X-ray spectroscopy stations of synchrotron radiation (SR) user-oriented centers for operation in a wide range of energy resolutions and at a high temporal resolution of the synchrotron experiment. The problem of providing a high SR flux density after the monochromator at required the monochromatization-system bandwidth is solved. A factor crucial for the quantitative analysis of the functional properties of the MMS is revealed and the optimum number of periods is determined. Analysis of the atomic and solid-state properties of elements and materials and detailed numerical simulation of the MMS allowed us to select several optimum pairs of materials for the synthesis of multilayer structures, in particular, Pt/Si and Au/Si. It is shown that reflectivities of more than 80% at a bandwidth of 4.4% can be achieved, which is very important for further practical development and the design of promising monochromators. The performed work concerns monochromatization systems for the SR energy range from 5 to 12 keV, which is the most sought after in X-ray spectroscopy.