Reflected electron-energy-loss spectra, differential inverse inelastic mean free paths, and angular resolved X-ray photoelectron spectra of a niobium sample

V. P. Afanas’ev; A. S. Gryazev; P. S. Kaplya; Yu. O. Andreyeva; O. Yu. Golovina

doi:10.1134/S1027451015060245

Reflected electron-energy-loss spectra, differential inverse inelastic mean free paths, and angular resolved X-ray photoelectron spectra of a niobium sample

Авторлар: Afanas’ev V.P.¹, Gryazev A.S.¹, Kaplya P.S.¹, Andreyeva Y.O.¹, Golovina O.Y.¹
Мекемелер:
1. National Research University “Moscow Power Engineering Institute”
Шығарылым: Том 10, № 1 (2016)
Беттер: 101-107
Бөлім: Article
URL: https://journals.rcsi.science/1027-4510/article/view/187796
DOI: https://doi.org/10.1134/S1027451015060245
ID: 187796

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Аннотация

A technique for recovering the differential inverse inelastic mean free paths (DIIMFP) of electrons in Nb from the reflected electron energy loss spectra (REELS) at initial energies of 5 to 40 keV using a threelayer model of the sample surface is presented. The recovered DIIMFP are used for analyzing X-ray photoelectron spectra measured at different viewing angles. Comparison with experimental data is carried out.