Microwave impedance of a tunnel junction in the theory of a near-field microscope with atomic resolution


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Аннотация

A theory is constructed for a near-field microwave microscope operating under tunneling breakdown between a probe and a conducting sample. Its informative characteristics are determined by the probe impedance, which is formed from the capacitive impedance Zp of the near-field probe–sample interaction and tunnel junction impedance Zt. A technique whereby the impedance Zp is calculated using coaxial geometry of the probe is developed. Some properties of the impedance Zt defined via the developed theory and published experimental data are investigated.

Авторлар туралы

S. Korolyov

Institute for Physics of Microstructures

Хат алмасуға жауапты Автор.
Email: pesh@ipmras.ru
Ресей, Nizhny Novgorod, 603950

A. Reznik

Institute for Physics of Microstructures; Lobachevsky State University of Nizhny Novgorod

Email: pesh@ipmras.ru
Ресей, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

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