Two-Flux Model of Charged-Particle Transport in a Condensed Material under Multiple Scattering: Average Energy Losses and Range of a Beam of Monoenergetic Electrons with Energies of 0.1 keV−1.0 MeV
- Авторлар: Mikheev N.N.1
-
Мекемелер:
- Laboratory of Cosmic Material Science, Institute of Crystallography, Russian Academy of Sciences – Branch of the Federal Scientific Research Center “Crystallography and Photonics”
- Шығарылым: Том 13, № 4 (2019)
- Беттер: 719-726
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/196410
- DOI: https://doi.org/10.1134/S1027451019040281
- ID: 196410
Дәйексөз келтіру
Аннотация
The results of using a two-flux model of charged-particle transport in a substance are presented to describe the average energy of a monoenergetic electron beam passed through a film target with known composition and a given thickness. Formulas describing the distribution of the average energy of the electron beam over the target depth and the energy dependence of the electron-beam range for electrons with an energy of 0.1 keV–1.0 MeV are obtained. The results of calculating the electron ranges for a wide range of materials, namely, from Be to Au, are given. The particle ranges calculated using the formulas are compared with the experimental results of measuring the depth of their penetration into the target.
Негізгі сөздер
Авторлар туралы
N. Mikheev
Laboratory of Cosmic Material Science, Institute of Crystallography, Russian Academy of Sciences – Branch of the Federal Scientific Research Center “Crystallography and Photonics”
Хат алмасуға жауапты Автор.
Email: kmikran@spark-mail.ru
Ресей, Kaluga, 248640
Қосымша файлдар
