Use of models of secondary X-ray fluorescence spectra to determine the measurement conditions in X-ray spectral methods of material analysis

Аннотация

The principles of construction and the components of a model of X-ray fluorescence signal generation are considered in this paper. It is shown that the developed model describes the X-ray spectra of various materials rather well. Issues with choosing the optimal parameters of measurements in the quantitative X-ray fluorescence analysis of individual samples using the constructed models are discussed.