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SEM identification of the amorphous state of Fe−B ribbons
Frolov A.M., Kraynova G.S., Dolzhikov S.V.
Investigation of secondary-emission signal formation in the low-voltage SEM mode
Kazmiruk V.V., Kurganov I.G., Osipov N.N., Podkopaev A.A., Savitskaya T.N.
Backscattered electron imaging of microand nanostructures: 4. Structures with a trapezoidal profile and large side-wall inclination angles
Novikov Y.A.
Formation of SEM Images in the Secondary Electron Mode. 2. Structures with a Trapezoidal Profile and Small Side-Wall Inclinations
Novikov Y.A.
Optimization of the Electron Optical System of a Scanning Electron Microscope for Measuring the Size of Micro- and Nanoobjects
Kazmiruk V.V., Kurganov I.G., Podkopaev A.A., Savitskaya T.N.
Influence of the Substrate Type on the Surface Morphology of Cu2ZnSnSe4 Thin Films
Baraishuk S.M., Tkachenko T.M., Stanchik A.V., Gremenok V.F., Bashkirov S.A., Wiertel M., Budzynski M., Turovets A.I., Yakovenko Y.S.
Calibration of a scanning electron microscope from two coordinates
Novikov Y.A.
Investigation of the closed porosity of functional ceramic materials by spin-echo small-angle neutron scattering
Pavlov K.A., Velichko E.V., Zabenkin V.N., Kraan W.H., Duif C.P., Bouwman W.G., Mikhailovskaya Z.A., Buyanova E.S., Grigoriev S.V.
Effect of the substrate material on the structure of carbon nanomaterials upon synthesis in a plasma jet reactor
Shavelkina M.B., Amirov R.H., Vorobyeva N.A., Katarzhis V.A.
First results of the application of scanning XRF analysis with synchrotron-radiation beams from the VEPP-3 to study the spatial distribution of trace elements in samples of stratiform chromite ores
Darin A.V., Veksler I.V., Rakshun Y.V.
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